| Ef-cd locus shortens rice maturity duration without yield penalty | |
| 論文作者 | Fang, J; Zhang, FT; Wang, HR; Wang, W; Zhao, F; Li, ZJ; Sun, CH; Chen, FM; Xu, F; Chang, SQ; Wu, L; Bu, QY; Wang, PR; Xie, JK; Chen, F; Huang, XH; Zhang, YJ; Zhu, XG; Han, B; Deng, XJ; Chu, CC |
| 期刊/會議名稱 | PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA |
| 論文年度 | 2019 |
| 論文類別 | Article |
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